21Maxim Integrated
USB Battery Charger Detectors
MAX14578E/MAX14578AE
The V
B
input withstands up to ±15kV (HBM) if bypassed
with a 1FF ceramic capacitor close to the pin. The ESD
structures withstand high ESD both in normal operation
and when the devices are powered down. After an ESD
event, the MAX14578E/MAX14578AE continue to func-
tion without latchup.
ESD Test Conditions
ESD performance depends on a variety of conditions.
Contact Maxim for a reliability report that documents test
setup, test methodology, and test results.
Human Body Model
Figure 12 shows the Human Body Model, and Figure 13
shows the current waveform it generates when dis-
charged into a low-impedance state. This model con-
sists of a 100pF capacitor charged to the ESD voltage of
interest that is then discharged into the device through
a 1.5kI resistor.
IEC 61000-4-2
The IEC 61000-4-2 standard covers ESD testing and per-
formance of finished equipment. However, it does not spe-
cifically refer to integrated circuits. The MAX4895E assists
in designing equipment to meet IEC 61000-4-2 without
the need for additional ESD-protection components.
The major difference between tests done using the
Human Body Model and IEC 61000-4-2 is higher peak
current in IEC 61000-4-2, because series resistance is
lower in the IEC 61000-4-2 model. Hence, the ESD with-
stand voltage measured to IEC 61000-4-2 is generally
lower than that measured using the Human Body Model.
Figure 14 shows the IEC 61000-4-2 model, and Figure
15 shows the current waveform for IEC 61000-4-2 ESD
Contact Discharge test.
Figure 12. Human Body ESD Test Model Figure 14. IEC 61000-4-2 ESD Test Model
Figure 13. Human Body Current Waveform Figure 15. IEC 61000-4-2 ESD Generator Current Waveform
CHARGE-CURRENT-
LIMIT RESISTOR
DISCHARGE
RESISTANCE
STORAGE
CAPACITOR
C
S
100pF
R
C
1MΩ
R
D
1.5kΩ
HIGH-
VOLTAGE
DC
SOURCE
DEVICE
UNDER
TEST
100%
36.8%
t
RL
TIME
t
DL
PEAK-TO-PEAK RINGING
(NOT DRAWN TO SCALE)
I
r
0
0
I
PEAK
(AMPS)
90%
10%
CHARGE-CURRENT-
LIMIT RESISTOR
DISCHARGE
RESISTANCE
STORAGE
CAPACITOR
C
S
150pF
R
C
50MΩ TO 100MΩ
R
D
330Ω
HIGH-
VOLTAGE
DC
SOURCE
DEVICE
UNDER
TEST
t
R
= 0.7ns TO 1ns
30ns
60ns
t
100%
90%
10%
I
PEAK
(AMPS)
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